@prefix skos: <http://www.w3.org/2004/02/skos/core#> .

<http://www.irandoc.acir/onto/irandoc/insp000944>
  skos:prefLabel "Semiconductor device testing"@en, "آزمون افزار نیم‌رسانا"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp0002915>
  skos:prefLabel "Remaining life assessment"@en, "ارزیابی عمر باقی‌مانده"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp000947>
  skos:prefLabel "Integrated circuit testing"@en, "آزمون مدار مجتمع"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp0006993>
  skos:prefLabel "Durability"@en, "دوام"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp000959>
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000944>, <http://www.irandoc.acir/onto/irandoc/insp000947>, <http://www.irandoc.acir/onto/irandoc/insp0002915>, <http://www.irandoc.acir/onto/irandoc/insp000952>, <http://www.irandoc.acir/onto/irandoc/insp000946>, <http://www.irandoc.acir/onto/irandoc/insp0002936>, <http://www.irandoc.acir/onto/irandoc/insp000943>, <http://www.irandoc.acir/onto/irandoc/insp0006993> ;
  a skos:Concept, <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept> ;
  skos:altLabel "accelerated testing"@en ;
  skos:prefLabel "Life testing"@en, "آزمون عمر مفید"@fa ;
  skos:broader <http://www.irandoc.acir/onto/irandoc/insp000999> .

<http://www.irandoc.acir/onto/irandoc/insp000943>
  skos:prefLabel "Electron tube testing"@en, "آزمون لامپ الکترونی"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp0002936>
  skos:prefLabel "Reliability"@en, "اطمینان‌پذیری"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp000952>
  skos:prefLabel "Electronic equipment testing"@en, "آزمون تجهیزات الکترونیکی"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp000946>
  skos:prefLabel "Electron device testing"@en, "آزمون دستگاه الکترونی"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:related <http://www.irandoc.acir/onto/irandoc/insp000959> .

<http://www.irandoc.acir/onto/irandoc/insp000999>
  skos:prefLabel "Testing"@en, "آزمون"@fa ;
  a <http://www.irandoc.ac.ir/onto/irandoc-meta/Concept>, skos:Concept ;
  skos:narrower <http://www.irandoc.acir/onto/irandoc/insp000959> .